2025 MAF Workshop

The Molecular Analysis Facility (MAF) at the University of Washington (UW) is an open-access instrumentation facility located in the Molecular Engineering & Science Building. The MAF’s extensive microscopy, spectroscopy, and surface science capabilities are available to UW researchers as well as researchers from other academic institutions, industry, and government labs. Users can be trained to independently perform experiments, or an experienced staff member can perform experiments for users.

Ariah Kidder - UW Molecular Analysis Facility

Monday &amp; Tuesday, August 4 &amp; 5: Lectures and instrument demos in the Molecular Analysis Facility at UW. Space is limited!

Architecture Hall (ARC)

The MAF Characterization Workshop includes lectures and instrument demonstrations.The demonstrations on MAF instruments will provide application examples for much of the material covered in the workshop lectures. The workshop is taught by experienced MAF staff, faculty and vendors. Attendees will learn the capabilities of various surface analysis methods, compositional analysis, and electron microscopy imaging as well as how to intelligently review the data from these characterization tools. The workshop will focus on the following methods: <ul><li>X-ray Photoelectron Spectroscopy (XPS/ESCA)</li><li>Secondary Ion Mass Spectrometry (SIMS)</li><li>Scanning Probe Microscopy (SPM/AFM)</li><li>X-Ray Diffraction (XRD)</li><li>Scanning Electron Microscopy (SEM)</li><li>Transmission Electron Microscopy (TEM)</li><li>Raman</li><li>EDS</li></ul>Note: To pay with a budget number (worktag), please email ariah@uw.edu with your information.

Monday, August 4

Registration, Coffee & Pastries – Architecture Building, ARC 160

Intro. to Characterization and the MAF 

Xray Photoelectron Spectroscopy (XPS)/Electron Spectroscopy for Chem Analysis

Coffee break

ToF-SIMS: Learning about surfaces by blowing them up

Introduction to XRD for materials characterization

Introduction to Vibrational Spectroscopy

Lunch

Raman, AFM and XRD, TEM, and SEM Instrument Demonstrations IN THE MAF

Demos - Round 1

Break

Demos - Round 2

Tuesday, August 5

Coffee & pastries – Architecture Building, ARC 160

Improved EDS spectral resolution: Why it is important at low energy and the benefits to semiconductor and battery applications

Improved EDS spectral resolution

Coffee Break

An Overview of Atomic Force Microscopy Methods

Transmission Electron Microscopy & Sample Preparation Techniques for TEM & SEM

End of workshop

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2025 MAF Workshop

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2025 MAF Workshop

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