Join us at the Silicon Valley USPTO on May 11, 3:00-4:00 p.m., for an update on Quality metrics, current updates on quality related programs, and open discussion on quality related topics from Greg Vidovich, Associate Deputy Commissioner for Patent Quality. This update will focus on Patent Product Indicators, which includes metrics on the correctness and clarity.

More Information about Patent Quality metrics are available at: https://www.uspto.gov/patent/initiatives/quality-metrics-1 .

This session is designed for patent practitioners, IP professionals, and those who would like to learn more about the patent quality and have an intermediate to advanced knowledge of the patent system.

The event is free, but space is limited.

Please note that the Silicon Valley USPTO is a federal facility. Attendees are required to present a valid form government-issued ID (driver's license or passport). Visitors may be subject to security screening.