Both Raman spectroscopy and scanning probe microscopy (SPM) proved to be extremely useful techniques for characterization of 2D materials, such as graphene, transition metal dichalcogenides (TMDC), black phosphorous, boron nitride, etc. During this seminar, we’ll demonstrate that properly integrated SPM and Raman offers new capabilities of cross-correlated nanoscale characterization of defects and structural/doping heterogeneities in these materials, through tip enhanced Raman scattering (TERS), tip enhanced photoluminescence (TEPL) and a large number of SPM imaging techniques performed under illumination with controlled wavelength and power.

We will discuss doping heterogeneity in WSe2, non-trivial grain boundary locations in MoSe2 and preferential etching along these grain boundaries, brightening of dark excitons and nanoscale exciton funneling towards the nanobubbles in WSe2 and WS2, with TERS/TEPL imaging.

REGISTERED participants will enjoy a reception with pizza, snacks and soft drinks followed by a seminar and live demonstration of the HORIBA XploRA Nano AFM-Raman system.