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Short Course: Foundations of Electron Microscopy

Hopkins Extreme Materials Institute (HEMI)

Tuesday, January 10, 2017 at 8:30 AM - Wednesday, January 11, 2017 at 5:00 PM (EST)

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Ticket Type Sales End Price Fee Quantity
Student Registration   more info Dec 20, 2016 $500.00 $0.00
Professional Registration   more info Dec 20, 2016 $900.00 $0.00

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Event Details

Instructor: Marc De Graef, PhD, Professor, Materials Science and Engineering, Carnegie Mellon University

About the course:

This two-day course provides an in-depth overview of the physics of image and diffraction pattern formation in both scanning electron microscopy (SEM) and transmission electron microscopy (TEM).  The course will begin with an overview of electron scattering, leading to the formulation of the Governing Equation (a form of the Schroedinger Equation) and several solution methods.  Emphasis will be placed on obtaining an understanding of the mechanisms of image and diffraction pattern formation, including ways to simulate such patterns. Both SEM and TEM techniques will be covered, both in the context of defect free crystals and image formation in the presence of lattice defects.  We conclude the course with a detailed introduction to the automated indexing of diffraction patterns. 

This course is directed at graduate students and post-doctoral researchers who wish to attain a deeper understanding of electron scattering techniques, including the simulation of images and diffraction patterns.

Specific topics to be covered include:

  • Basic Crystallography
  • Electron Scattering by Atoms, Unit Cells, and Crystals
  • Experimental Modalities and Geometries: SEM and TEM
  • Electron scattering: the Governing Equation
  • Solution Methods
  • TEM: Electron Diffraction from Perfect Crystals
  • SEM: Electron Diffraction from Perfect Crystals
  • Defects in Crystals: Applications for SEM and TEM
  • Orientation Representations
  • Dictionary-based Indexing of Electron Diffraction Patterns

About the Instructor:

Professor De Graef received his BS and MS degrees in physics from the University of Antwerp (Belgium) in 1983, and his Ph.D. in physics from the Catholic University of Leuven (Belgium) in 1989, with a thesis on copper-based shape memory alloys. He then spent three and a half years as a post-doctoral researcher in the Materials Department at the University of California at Santa Barbara before joining Carnegie Mellon in 1993 as an assistant professor.  He is currently full professor and co-director of the J. Earle and Mary Roberts Materials Characterization Laboratory.  He is a Fellow of the Microscopy Society of America, and he received the TMS Educator Award in 2012.  Professor De Graef’s research interests lie in the area of microstructural characterization of structural intermetallics and magnetic materials. His current focus is on the development of experimental and modeling techniques for the quantitative analysis of electron scattering data, including defect images and diffraction patterns, as well as indexing techniques for such diffraction patterns. He has published more that 250 papers in peer-reviewed journals, as well as two text books.


Have questions about Short Course: Foundations of Electron Microscopy? Contact Hopkins Extreme Materials Institute (HEMI)

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When & Where


Johns-Hopkins - Homewood
3101 Wyman Park Drive
Malone Hall G-33/35
Baltimore, MD 21211

Tuesday, January 10, 2017 at 8:30 AM - Wednesday, January 11, 2017 at 5:00 PM (EST)


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Hopkins Extreme Materials Institute (HEMI)

HEMI addresses the fundamental science issues associated with materials under extreme conditions. Our aim is to teach the world how to think about materials in extreme environments.

hemi.jhu.edu

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Short Course: Foundations of Electron Microscopy
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