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Achieving Peak Performance with Atomic Force Microscopy (AFM)

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Anton Paar USA

10215 Timber Ridge Drive

Ashland, VA 23005

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Easy to use, robust, simple cantilever exchange...not concepts often associated with use of an AFM. Yet these are the key design elements of the Tosca™ 400 Atomic Force Microscope.

This workshop is geared to industrial and academic research where there is continuously growing demand for complex nano-surface analysis but limited time for mastery of complex, nuanced measurement techniques.

The theoretical background and measurement concept for characterization by AFM will be covered as will the unique features of the Tosca™ 400 AFM – the first plug and play AFM in the market which combines premium technology with high level automation for unsurpassed usability.

The workshop includes a balance between lecture and hands-on sessions for an effective learning experience. Attendees will be able to explore various applications of AFM such as materials science, polymers, coatings, hard metallic and ceramic systems, semiconductors, and soft matter. By the end of the workshop, attendees will have mastery of use of the Tosca™ AFM.

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Anton Paar USA

10215 Timber Ridge Drive

Ashland, VA 23005

View Map

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