|Date:||Thursday, July 11, 2013|
7:30 AM – Breakfast and Registration
San Francisco Marriott Marquis
The sub-20 nm node is marked by skyrocketing capital expenditures, the adoption of difficult process technologies and an ever-increasing number of process steps. Yield is not only a challenge, but also a key lever to the semiconductor business model. This Entegris-sponsored forum will explore key yield challenges and defect reduction approaches at the sub-20 nm node from three points of view – equipment, process and materials.
The event will begin with a keynote speech, continue with brief overviews from leading equipment, consumable and chemical suppliers in the industry, and conclude with an interactive panel discussion.
|7:30-8:00 a.m||Continental Breakfast Buffet and Registration|
Defect Reduction Solutions from Key Players
All attendees will be entered for a chance to win an iPad® mini during this event.*
*No purchase necessary. Void where prohibited.
When & Where
To ensure product performance throughout the production process, we have extensive capabilities in chemical, mechanical, and physical property analysis. Entegris focuses on understanding your processes, sources of contamination and on developing material enabled solutions to ensure the cleanliness and integrity of your process. This experience offers you a broad portfolio of more than 17,000 materials, process control solutions and material handling products leveraged between the Semiconductor, Solar, Energy, LED, Life Sciences, Consumer Electronics, Data Storage, Display, Petrochemical and Aerospace markets.
With a broad product offering, advanced manufacturing capabilities, worldwide infrastructure and unmatched technical expertise Entegris provides proven performance, efficiency and reliability in your processes.
At Entegris, we are creating a material advantage.