Yield Breakfast Forum 2013: Defect Reduction in the Sub-20 nm Era
Thursday, July 11, 2013 from 7:30 AM to 10:00 AM (PDT)
San Francisco, CA
|Date:||Thursday, July 11, 2013|
7:30 AM – Breakfast and Registration
San Francisco Marriott Marquis
The sub-20 nm node is marked by skyrocketing capital expenditures, the adoption of difficult process technologies and an ever-increasing number of process steps. Yield is not only a challenge, but also a key lever to the semiconductor business model. This Entegris-sponsored forum will explore key yield challenges and defect reduction approaches at the sub-20 nm node from three points of view – equipment, process and materials.
The event will begin with a keynote speech, continue with brief overviews from leading equipment, consumable and chemical suppliers in the industry, and conclude with an interactive panel discussion.
|7:30-8:00 a.m||Continental Breakfast Buffet and Registration|
Defect Reduction Solutions from Key Players
All attendees will be entered for a chance to win an iPad® mini during this event.*
*No purchase necessary. Void where prohibited.
When & Where
For more than 40 years, Entegris has delivered innovative solutions to the semiconductor, microelectronics, energy, life sciences and other technology markets.
Using its unique combination of materials science and manufacturing process expertise, Entegris is solving the most difficult purification, process control and material protection problems in a broadening array of high-performance industries.